›› 2017, Vol. 39 ›› Issue (2): 134-138.doi: 10. 16507 /j.issn.1006-6055.2017.03.005

• 科技态势与趋势 • 上一篇    下一篇

透射式电子背散射衍射技术( t-EBSD) 在材料学中的应用研究进展

覃丽禄   

  1. 重庆大学材料科学与工程学院,重庆400040
  • 收稿日期:2016-08-15 修回日期:2016-09-26 出版日期:2017-04-25 发布日期:2017-04-26
  • 基金资助:
    国家自然科学基金( 51301212) 资助

Research Progress in Application of Transmission Electron Back-scattering Diffraction( t-EBSD) Technique for Materials Science

QIN Lilu   

  1. College of Materials Science and Engineering,Chongqing University,Chongqing 400040,China
  • Received:2016-08-15 Revised:2016-09-26 Online:2017-04-25 Published:2017-04-26

摘要:

t-EBSD 技术是自2012 年发展起来的新兴测试技术,本文介绍了t-EBSD 测试分析技术的原理,总结了t-EBSD 技术在材料学中的应用及其与其它分析测试技术结合的应用研究,并展望了t-EBSD 技术研究应用的发展趋势。目前,t-EBSD 技术主要用于超细晶粒、大形变量金属、氧化物薄膜等研究,未来t-EBSD 技术将会与多种分析技术相结合,从而扩大高分辨微观晶体结构分析的应用范围。

关键词:  t-EBSD, 高分辨率, 微区分析, 晶体结构, 取向

Abstract:

The t-EBSD technique was proposed since 2012. In this paper,the principle of t-EBSD was introduced. The t-EBSD used in the materials science and the application of this technique combined with other techniques was concluded. Meanwhile,the future research of t-EBSD was proposed. At present,the t-EBSD was used in the research areas such as the super-fined grains,the large-variable metals and oxide film. In the future,the t-EBSD will be combined with more analytical techniques,and the applied range of the high resolution micro crystal structure analysis will be expanded.

Key words:  t-EBSD, high resolution, micro-area analysis, crystal structure, orientation

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